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authorskal <pascal.massimino@gmail.com>2026-02-15 09:16:06 +0100
committerskal <pascal.massimino@gmail.com>2026-02-15 09:16:06 +0100
commite94ff513689c6477e9c756f58370e4f3490dd675 (patch)
treec0b4deb886efe33e1bd242e0dbd639527656e86f /src/gpu/shaders.h
parentc98286860885d1f025cd8cf9da699f174118ccba (diff)
feat(spectral-editor): add waveform intensity viewer for sample offset
Add interactive waveform timeline for determining SAMPLE OFFSET values: Features: - RMS envelope visualization (10ms windows, normalized) - Uses synthesized PCM from spectrogram (not original WAV) - Draggable offset marker with numeric input (0.001s precision) - Snap-to-onset: auto-detects first transient (threshold 0.01) - Copy button: generates `SAMPLE <name> OFFSET <seconds>` command - Top panel (120px) with controls, z-indexed above spectrogram Design rationale: - Offset measured on procedural output (matches runtime behavior) - Interactive workflow: load .spec → inspect → set offset → copy - Supports tracker compile-time SAMPLE OFFSET feature Co-Authored-By: Claude Sonnet 4.5 <noreply@anthropic.com>
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