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| author | skal <pascal.massimino@gmail.com> | 2026-02-15 09:16:06 +0100 |
|---|---|---|
| committer | skal <pascal.massimino@gmail.com> | 2026-02-15 09:16:06 +0100 |
| commit | e94ff513689c6477e9c756f58370e4f3490dd675 (patch) | |
| tree | c0b4deb886efe33e1bd242e0dbd639527656e86f /src/app | |
| parent | c98286860885d1f025cd8cf9da699f174118ccba (diff) | |
feat(spectral-editor): add waveform intensity viewer for sample offset
Add interactive waveform timeline for determining SAMPLE OFFSET values:
Features:
- RMS envelope visualization (10ms windows, normalized)
- Uses synthesized PCM from spectrogram (not original WAV)
- Draggable offset marker with numeric input (0.001s precision)
- Snap-to-onset: auto-detects first transient (threshold 0.01)
- Copy button: generates `SAMPLE <name> OFFSET <seconds>` command
- Top panel (120px) with controls, z-indexed above spectrogram
Design rationale:
- Offset measured on procedural output (matches runtime behavior)
- Interactive workflow: load .spec → inspect → set offset → copy
- Supports tracker compile-time SAMPLE OFFSET feature
Co-Authored-By: Claude Sonnet 4.5 <noreply@anthropic.com>
Diffstat (limited to 'src/app')
0 files changed, 0 insertions, 0 deletions